Quantum Interference And Frequency Metrology Frequency metrology MetQuIn (click on me). Related Papers Frequency metrology by use of Quantum Interference, N. Ph. Georgiades, ES Polzik and HJ Kimble, Opt. http://www.its.caltech.edu/~qoptics/QIHome/QIHome.html
Extractions: California Institute of Technology INTRODUCTION Our group has extensively studied both theoretically as well as experimentally the subject of Quantum Interference (QI) in multiphoton atomic processes as well as its possible applications to frequency metrology and other commercial applications. The origin of quantum interference in multiphoton excitations in the presence of multiple lasers arises due to the presence of multiple excitation pathways, the amplitudes of which coherently interfere to result in a fringe pattern of the excited state population (see logo cartoon above). Viewed in a different way, the atom behaves as a quantum nonlinear mixer (QNM) with demodulation capabilities that extend to 100's of THz. Our results are discussed in several papers, QNM is pending a patent, a computerized search algorithm for optimizing a particular experimental realization has been developed and an interactive quantum interference calculator (QuInC) based on our theory has been implemented and presented here. Quantum Interference Calculator: QuInC (click on me) Frequency Metrology: MetQuIn (click on me) Patent: U.S. Patent Application S/N 08/799,169
Digital Surf Home Page Supplies metrology components to build equipment such as profilers, topography machines, scanning probe microscopes. Develops topography software. http://www.digitalsurf.fr
Optical Metrology Lab Optical metrology Laboratory. of the Advanced Light Source. The Optical metrology Laboratory (OML) assures the quality of the optical http://www-esg.lbl.gov/OML/
NRLM NRLM consists of four research departments, addressing quantum, thermophysical, mechanical metrology and measurement system, located in Tsukuba, Japan. http://www.aist.go.jp/NRLM/english/
Frazier Precision Instrument Company, Inc. Designs, manufactures, markets, and services instruments for the aerospace, architectural, automotive, filter, metrology, nonwovens, paper, and textile industries. http://www.frazierinstrument.com/home.htm
Extractions: Facilities Frazier Instrument Company produces over a dozen test instruments for the textile (including carpet, wall coverings, and nonwovens), filter (wet as well as dry), paper, floor covering, and metrology industries. Frazier also can provide prototype assistance in design and manufacture of instruments for the entrepreneur. Frazier instruments are routinely used worldwide by businesses, governments, universities, and militaries for research, quality control, acceptance testing, and litigation.
Metrology In Chemistry metrology in Chemistry metrology in Chemistry metrology in chemistry is the science of chemical measurements. Evaluation of the survey on chemical metrology. http://www.irl.cri.nz/msl/si-units/chemical/metrology.html
Extractions: Metrology in chemistry is the science of chemical measurements. It is concerned with the development of a structured support system based on traceable standards. The principles of chemical and physical metrology are unique and the theoretical concepts of traceability, uncertainty, calibration etc are the same. However, the practical application to real measurement problems in a systematic way is different. The definition of traceability can be found in the International Vocabulary of Basic and General Terms in Metrology (VIM). From a functional viewpoint, comparability is the primary requirement, and traceability is a tool to help achieve comparability. From a metrological point of view, traceability is the heart of matter in measurement and provides the basis for reliable measurements which are comparable.
Taylor Hobson - Welcome Manufacturer of metrology instruments, surface finish and form, electrooptical, dimensional and roundness gauges. http://www.taylor-hobson.com/
Extractions: Talysurf CCI 3000 delivers the ultimate in high precision 3D topography. Excellent data resolution in both X and Y axes combined with a very low missing data rate contribute to outstanding system performance. More than 1,000,000 data points are collected in a matter of seconds over areas as big as 7.2mm x 7.2mm with 0.03 angstrom Rq repeatability.
:: Ez2Find :: Industrial Metrology Guide Industrial metrology, Global Metasearch Any Invisible Web, Metasearch NIST. Guides, Industrial metrology. ez2Find Home Directory http://ez2find.com/cgi-bin/directory/meta/search.pl/Business/Industrial_Goods_an
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International Metrology Congress Translate this page présentation du collège français de métrologie et de ses activités, regroupement de professionnels du milieu de la métrologie. http://www.cfmetrologie.com/index_congress.htm
Continental Microwave - Home Page Designs and manufactures custom waveguide components, filters, flexible waveguide, high reliability satellite waveguide, couplers, waveguide test metrology and diplexers. http://www.contmicro.com
Metrology Services For Surface Form And Finish offers metrology services and measurement equipment rental for surface form and finish measurement.With our expertise in 3D noncontact metrology we provide http://www.solarius-inc.com/html/metrology.html
Extractions: At Solarius Development we realize that there is a need to incorporate high accuracy form and finish measurements in your design process. However your budget may not allow for the purchase of a measuring tool or the need is short lived and therefore a tool cannot be justified. We have solutions. Find out about options of service, system rental, or system time here at Solarius. Please contact us for further information. Home Technology Products Applications ... Contact
Extractions: Choose your product Air/electronic amplifiers Air/electronic converters Bench gauges for I.D. Bench gauges for O.D. Column amplifiers Digital indicators Electronic amplifiers Gauging probes Inductive probes Industrial PC Interface boxes Manual bore gauges Manual ring gauges Manual snap gauges Measuring armsets Measuring cells Microcolumn amplifiers Pencil probes Software
SADC SQAM Home Page Welcome to the SADC webpage on. Standardisation, Quality Assurance, Accreditation and metrology. (SQAM). http://www.sadc-sqam.org/Default.htm
Extractions: Welcome to the SADC webpage on S tandardisation, Q uality Assurance, A ccreditation and M etrology SQAM SADC Background Regional SQAM information National SQAM information Links The SADC SQAM webserver and the data collected for the various pages and databases accessible on this website were sponsored by a 1998 grant from the South African Department of Arts, Culture, Science and Technology (DACST)
Extractions: The Solartron brand is synonymous with high quality, high precision measurement, its products are used throughout the Process, Energy and Manufacturing industries. The Solartron Group comprises of four focused business units addressing specific markets segments: Solartron Mobrey serves the process and utility sector. Solartron Metrology focusses on the inspection and quality control sector. Solartron Mobrey is a market leading supplier of level, pressure, flow, suspended solids, viscosity, density, data acquisition and steam measurement products to the process and utility industrial sectors. A combination of quality products and total customer support makes Solartron Mobrey the supplier of choice for the discerning user. Including KDG Instruments and Bestobell Service, operating units of Solartron Mobrey. Solartron Mobrey Ltd
ImageWarp Image Analysis Software Image editing, processing and analysis software for machine vision, metrology, lab automation, bioinformatics and material analysis. Compatibility with BitFlow imaging hardware and standard video capture devices. http://www.imagewarp.com/
Extractions: image analysis at Warp speed... summary ... contact us ImageWarp is a BitFlow Imaging Solution ImageWarp is universal image analysis, processing and editing software, which combines the power of graphic development environment, comprehensive image analysis toolset, and programming development techniques. Designed to work under Windows 98/ME and NT/2000/XP, imageWarp offers full compatibility with BitFlow imaging hardware and standard video capture devices, hundreds of high-performance image processing and measurements functions, built-in automatic scripting language with VB-like integrated development environment, databases and spreadsheets support, and various graphic representation of output data. Unlike any other image analysis software, imageWarp incorporates graphic editing tools and functions that work with a wide variety of image types including 16-bit, 32-bit and 64-bit (complex) images. A multiple window interface allows for simultaneous display of static and live images, charts, and measurements for the rapid creation of custom applications and development of new imaging techniques. ImageWarp employs a multithreading processing engine, which provides parallel execution of several functions at the same time and automatic parallelization for systems with multiple CPUs.
Surface Metrology Guide - Home (PDI) produced this Surface metrology Guide in an effort to help its current and future customers learn more about surface finish and related subjects. http://www.predev.com/smg/
Extractions: Registered to ISO 9001 ... Precision Devices Inc. (PDI) produced this Surface Metrology Guide in an effort to help its current and future customers learn more about surface finish and related subjects. It attempts to serve several distinct purposes in one single reference. First, it presents and defines concepts and ideas in surface finish measurement. Secondly, it summarizes current practice and instrumentation for surface measurement. Thirdly, it rigorously and thoroughly defines and presents the mathematics of surface finish analysis. Finally, it gives a review of latest developments of the subject and national and international standardization activities in the area. Both the scope and details of the contents will be evolving over time. We welcome suggestions and comments from you. Table of Contents Surfaces and Profiles Specification of Surface Texture Measuring Instruments Reference Specimens and Calibration ... Surface Finish Standards
WorldExperts: Dimitri Favvas - Industrial Metrology Solutions Consultant for industrial metrology and quality assurance. Past work includes major hydroelectric power generation projects in countried such as the US, Canada, China, South Korea and Brazil. http://www.worldexperts.com/dfavvas/
Extractions: Science and technology Manufacturing Metrology Introduction One of the most important elements on any industrial component is its design. The better the design, the better its purpose is served. Then comes its compliance to the design. The material and the shape. The dimensional aspect is sometimes demanding and complicated. Sometimes requires very close tolerances and a difficult to produce shape. In order to make something to a closely defined shape; one should be able to measure it first. Dimitri Favvas with some 45 years experience in industrial environment, may have solutions to some of the problems related to measuring. It is his nature to get involved whenever is something new and exciting. He has the ability and patience to study a subject, and propose a how to do it solution.
M&M-NML-"National Metrology Laboratory" Offers internationally traceable measuring standards and measurements for the government of South Africa. http://www.nml.csir.co.za/
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Veonis Technologies Supplies equipment, materials and services to the semiconductor industry. Specialises in metrology equipment and systems for wafer handling and automation. ( Europe ) http://www.veonis.com/
