101. Metrology Research Institute Research in measurement areas of physics, fiberoptics and electronics. Includes details of courses, PhD degree, calibration services, staff profiles and contacts at Helsinki University of Technology, Finland. http://metrology.hut.fi/

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102. Data Storage 3D Metrology Structural Process Control for thinfilm head manufacturing is realized through three-dimensional metrology of critical features to provide rapid verification http://www.feicompany.com/eng/data/structural.html

DATA STORAGE Overview Structual NanoFabrication ... home While current-generation thin-film heads are manufactured using many of the same processes used by the semiconductor industry, the data storage industry has developed technology requirements that are surpassing those of the semiconductor industry. Tenth micron head geometries are already in development. These shrinking head geometries combined with heavy downward pricing pressure make Structural Process Control essential. Structural Process Control for thin-film head manufacturing is realized through three-dimensional metrology of critical features to provide rapid verification that the process is or isn't proceeding optimally. FEI's IC3D series of DualBeam tools provide the distinct advantage of offering access to critical structures such as the reader element and ABS at the wafer level, while the devices are still being fabricated. The IC3D series tools obtain 3D measurements of such critical process parameters as lift off, reader-writer offset, ABS, and stripe-throat offset. Providing these dimensions early in the process contributes greatly to improving process yields. In the slider fab, IC3D series tools calibrate the rowbar lapping process, through measurements of throat height of the write element, stripe height of read element, as well as detecting pole-tip recession. After slider fabrication, these tools provide a final check on critical dimensions and detect surface defects, contamination, smearing, coating defects, and ESD damage.

103. Feanor Ltd Industrial and length metrology consulting, research, software for calibration, SPC software. http://www.feanor.com/

Feanor OÜ Research and consulting in dimensional and laser metrology Design and supply of special cutting tools Software for Quality and calibration Technical translations Download our PDF broschure (English) We develop and supply high quality special cutting tools We develop and supply custom software applications in many areas including statistical process control (SPC), sampling acceptance (MIL STD 105, MIL STD 414, MIL STD 1235), data acquisition in manual or automatic manufacturing processes (FMS), calibration of measuring instruments, custom software for machine tool setting optimization. Other activities include: Industrial length metrology. metrology section (English) if you want to know more about our research projects. We're looking for co-operation and research partners. Gear metrology, form metrology. Software for calibration. here your demo. Training courses : training courses on industrial and lab metrology, Statistical Process Control, Sampling Acceptance, CSP (Continuous Sampling Plans), ISO and MIL standards, reliability statistics, DOE and FMEA. Currently available in English, German, Italian and French. Translation services (it-uk-de-fr-sp-ru-ee). We have more than 13 years experience in technical translations of user manuals, technical books and reviews (metrology, mechanical engineering, software, machine tools).

104. FEI 3D Metrology, Device Geometries, 3D Metrology, Fab, Whole Wafers, Load Lock, Our goals are to, enhance yields, reduce time to data, whole wafer sitespecific analysis, in FAB 3D metrology. Better performance and lower costs. http://www.feicompany.com/eng/products/control.html

Semiconductors Overview Structural Diagnostics Structural Process ... home As device geometries continue to shrink and new materials are introduced, the structural complexity of today's semiconductors grows exponentially. Ensuring the critical dimensions of advanced device microstructures throughout the manufacturing process is critical to the performance of your manufacturing process. FEI's powerful DualBeam™ advantage brings advanced 3D metrology into the fab for fully automated Structural Process Control and effective yield enhancement. With site specific sampling, the process is non destructive to whole wafers reducing the waste of time and materials associated with cleaving. FEI Structural Process Control™ Products Automated IC3D™ tools delivering advanced 3D metrology for Structural Process Control applications. (200mm, load lock)

105. Analytical Instruments Group Distributor for AST Products (metrology tools). http://www.brewerscience.com/aigroup/

Products Links Safety A.I. Group The right source for Video Contact Angle Measurement tools for all applications. Visit our products pages if you need to trouble shoot adhesion problems, verify surface treatment, or study a surfaces wetability. We have machines for grains of rice up to 750mm x 900mm flat panel displays. Contact

106. Boch Manufacture of cutting tools in HSS, hard metal and PCD special drills, cutters, reamers, counterborers, taps, integral, carbide tipped and indexable milling cutters and provice standards, measurement and testing; calibration of measuring instruments and development of new products in optical and laser metrology. http://www.boch.net

Boch special cutting tools and measuring systems Research and consulting in laser and dimensional metrology and torque calibration Software for quality control and calibration Technical translation services Design of special cutting tools in HSS, hard metal and PCD: special drills, cutters, reamers, counterborers, taps, integral, carbide tipped and indexable milling cutters. Our custom tools are delivered locally and worldwide (Europe, Singapore, South Africa, South America). They increase machining performance in aerospace, defence, automotive industries.Just fax or e-mail us your drawing or sketch with specifications and we'll offer you our technical assistance, price and delivery commitments. For any info please dial +39.348.4121280. We develop and supply software applications in many areas including statistical process control (SPC), sampling acceptance (MIL STD 105 , 414, 1235), data acquisition in manual or automatic manufacturing processes and FMS, calibration MSA Our consulting services include: Industrial length metrology - laser interferometry . Our research department participates in EU "Standards, Measurement and Testing" research projects on development of new products in optical and laser metrology

107. Guaranteeing Bounds On Uncertainty In Metrology Guaranteeing bounds on uncertainty in metrology. and other problems in computational metrology, SIAM News, Vol. 29/No.3, April 1996, pp. 8,9,17. http://solon.cma.univie.ac.at/~neum/glopt/metrology.html

Guaranteeing bounds on uncertainty in metrology I saw in the current (April 1996) issue of SIAM News an article on metrology that contains unsolved problems regarding uncertainty. This looks like an invitation for interval methods... The exact reference is V. Srinivasan, How tall is the pyramid of Cheops?... and other problems in computational metrology, SIAM News, Vol. 29/No.3, April 1996, pp. 8,9,17. The author's email address is vasan@watson.ibm.com On p. 17, Srinivasan says: ``All current implementations of computational metrology algorithms ignore uncertainties in input data and attempt to solve deterministic versions of the problems. Most, if not all, of them use floating-point arithmetic and therefore are subject to the vagaries of round-off errors. Even in these deterministic versions, therefore, currently available software cannot promise solutions of guaranteed precision. In some cases, attempts have been made to apply inverse error analysis; that is, the output can be provably claimed to be the exact solution to some perturbed input. This, of course, does not solve the problems in which we know the input uncertainties and want to know the output uncertainties.'' ``It is sometimes possible, taking input uncertainties into account, to give bounds for the uncertainties of the output. It is important to remember, however, that for practical reasons loose bounds are not very useful. A loose estimate for measurement uncertainty may underestimate real variations in actual parts. It may also lead to overspecification of the required capabilities of manufacturing processes. Both outcomes are clearly undesirable.''

108. Semiconductor Equipment | Logan Technologies, L.P. Buy and sell semiconductor equipment. Specialize in plasma etch/ash/strip and metrology equipment. http://logantechlp.com

Logan Technologies, LP is a seller and broker of preowned, used, excess, and surplus semiconductor fabrication equipment. We deal in equipment used in the fabrication, manufacturing, assembly, and testing of semiconductors. Just In: Semitool WST-406 Solvent Processor (New) ULVAC Phoenix Enviro Tegal Model 915 Barrel Asher/Etcher March Instruments PX-1000 If you want to buy or sell a item, please click over to our Contact Page. If you want to view the Inventory list, click here. Logan Technologies, LP 3213 Buckingham Court Temple, Texas 76502 Billy@logantechlp.com Contact Us Inventory List Home 3213 Buckingham Court, Temple, Texas 76502. Phone: 254-773-4070 Fax: 254-773-0041

109. Fsm.html Frequency Standards and metrology Research Group (FSM Group). The major goal of the FSM Group is to develop new frequency standards http://www.fsm.physics.uwa.edu.au/

Frequency Standards and Metrology Research Group (FSM Group) The major goal of the FSM Group is to develop new frequency standards that may be used as precision tools to test the foundations of physics (in the optical and microwave domains). Proposed experiments include tests of Local Lorentz Invariance , search for drifts in the Fine Structure Constant and tests of Local Position Invariance. In summary we propose to test the founding theories of the Standard Model of Physics and Special and General Relativity, through the use of the new generation of frequency standards. We are also dedicated to commercializing our inventions and we have many patents in conjunction with industry. Our research programs necessarily include strong international and industrial collaborations, please keep reading for more details. The FSM research group is divided into Microwave and Optical Divisions . If you wish to know more about the projects and Research Staff within these divisions, then please click on the links listed below. If you can't find what you need, or if there is too little information to satisfy you, then please don't hesitate to contact the person listed after each of the listed projects (click on their name). Also, if you are interested in joining our group as a Postgraduate Researcher (Honours, Masters, Ph.D.) follow this link.

110. Welcome To TTi TTI provides short courses for engineers and technicians on vibration and shock, instrumentation, data acquisition, fixturing, and design, also metrology, calibration, electronics and many other topics. http://www.ttiedu.com

Welcome to the TTi home page! Explore our course offerings specialist certificate programs , and learn about our unique instructional approach . Our on-line newsletter contains technical articles, client profiles and more. TTi has been your specialized technical education source since 1962. Remember, it's not enough to become qualified; you must remain qualified. Email Training@ttiedu.com Technology Training, Inc. contact information Telephone Toll-free 866-TTi-4Edu (866-884-4338) Search the TTi Site: Search ANY word Search ALL words Search EXACT phrase Help Technology Training, Inc. 040301 BJA

111. Metrologie Und Akkreditierung Schweiz (metas) Activities, accreditation, legal aspects, fields of measurement, definitions of metric, SI, US and UK units. http://www.metas.ch/en/

112. Hexagon / Investors The business of the Hexagon metrology business area consists of supplying measuring technology, which is essential for producing products consisting of more http://metrology.hexagon.se/

June 6, 2004. GLOBAL co-ordinate measuring machine (CMM) The business of the Hexagon Metrology business area consists of supplying measuring technology, which is essential for producing products consisting of more than one component. The metrology equipment measures all the components used in a product to ensure that they fit together. Metrology allows a producer to assure the quality of his product. The primary users of metrology are the automotive industry including its sub-contractors, the aerospace and defence industries, the engineering industry, electronics, IT and the medical sector. LATEST NEWS March, HEXAGON ACQUIRES ITALIAN METROLOGY OPERATION PDF Hexagon has acquired the assets of the, bankrupt Italian metrology supplier Poli S.p.A., from the provincial court in Vercelli, Italy. The Acquisition includes an inven-tory of coordinate measurement machines (CMMs) and spare parts, certain manufac-turing equipment as well as immaterial commercial rights and information. March, 2004

113. Metrology Teaching Introduction Courses Doctors Degree Research Introduction Optical Radiation Measurements Length metrology FiberOptics Microtechnologies Quantum http://www.hut.fi/Yksikot/Mittaustekniikka/

Visit the pages of our laboratory at http://metrology.hut.fi/cgi-bin/index.cgi

114. Centralna Izba Pomiarów Telekomunikacyjnych Time and frequency, fundamental standards, fiber test, metrology calibration. http://www.itl.waw.pl/p12

Centralna Izba Pomiarów Telekomunikacyjnych Ostatnie zmiany: Instytut £±czno¶ci - Centralna Izba Pomiarów Telekomunikacyjnych ul. Szachowa 1, 04-894 Warszawa tel. (+48 22) 512 83 83, 512 84 07, faks (+48 22) 872 43 37 e-mail: cipt@itl.waw.pl

115. Neutron Field Metrology National Institute of Standards and Technology (NIST) Physics Laboratory Ionizing Radiation Division Neutron Field metrology. RO CITY STATE http://www4.nas.edu/pga/rap.nsf/ByTitle/50.84.61.B1796?OpenDocument

116. Metryx Homepage Metryx provide innovative metrology solutions to the semiconductor manufacturing industry by utilizing advance weighing technology. http://www.metryx.net

117. Dimensional Metrology Of Radiometric Apertures National Institute of Standards and Technology (NIST) Physics Laboratory Optical Technology Division Dimensional metrology of Radiometric Apertures. http://www4.nas.edu/pga/rap.nsf/ByTitle/50.84.41.B5242?OpenDocument

118. DFM Dansk Version Primarily supporting national industry with metrological knowledge and calibrations with international recognition. Includes priced services in electrolytic conductivity, optical power and wavelength, surface topography. Course in precision and nanometrology, and news about nanotechnology. http://www.dfm.dtu.dk/

119. Semiconductor Manufacturing Process Equipment From TCG Inc. Manufacturers' representatives for semiconductor process and inspection equipment. Mask alignment, contact and proximity printing, automated visual inspection, surface profiling, wafer handling and sorting, wafer thickness gauging and metrology. http://www.tcg-rep.com/

Read our Mission Statement Read our Mission Statement

120. About Croatian Metrology Society Twentyfifth Anniversary of the Croatian metrology Society (HMD). Zagreb, September 25-27, 2002. 18 th metrology Symposium. October 8-10, 2001 Cavtat, Croatia. http://www.hmd.hr/english/

Twenty-fifth Anniversary of the Croatian Metrology Society (HMD) Tuesday, 9 December 2003 Faculty of Electrical Engineering and Computing Unska 3 Programme of the Twenty-fifth Anniversary of the Croatian Metrology Society Hall D1 Invited guests: representatives of the EUROMET, EUROLAB, EURACHEM, Delegation of the European Commission, ILAC, IMEKO, NCSLI, DZNM, MIRS. XVII IMEKO WORLD CONGRESS International Measurement Confederation Dubrovnik, June 22-27, 2003 th IMEKO TC 4 International Symposium Zagreb, September 25-27, 2002 th Metrology Symposium October 8-10, 2001 Cavtat, Croatia Seminars World by Measure Comments and inquires regarding these pages should be sent to hmd@hmd.hr

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